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112![JOURNAL OF ELECTRONIC TESTING: Theory and Applications, 3, [removed]1992 Kluwer Academic Publishers, Boston. Manufactured in The Netherlands. An Efficient Design of Embedded Memories and their Testability Analysi JOURNAL OF ELECTRONIC TESTING: Theory and Applications, 3, [removed]1992 Kluwer Academic Publishers, Boston. Manufactured in The Netherlands. An Efficient Design of Embedded Memories and their Testability Analysi](https://www.pdfsearch.io/img/6e07e66e2217c6dc992ea4137c771b15.jpg) | Add to Reading ListSource URL: deepblue.lib.umich.eduLanguage: English - Date: 2015-01-19 11:48:27
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113![Server Burn-In Technical Brief Kingston’s Server Memory Dynamic Burn-In Testing: Setting a New Standard of Reliability Rev. 1.1 Server Burn-In Technical Brief Kingston’s Server Memory Dynamic Burn-In Testing: Setting a New Standard of Reliability Rev. 1.1](https://www.pdfsearch.io/img/9e51c0f651a246201f966ab871e32545.jpg) | Add to Reading ListSource URL: media.kingston.comLanguage: English - Date: 2013-09-10 20:20:22
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114![Effective ADC Linearity Testing Effective ADC Linearity Testing](https://www.pdfsearch.io/img/8b67ce89d0748844d957591093dc48e7.jpg) | Add to Reading ListSource URL: eprints.biblio.unitn.itLanguage: English - Date: 2012-02-28 09:17:19
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115![Systems engineering process / Acceptance testing / Dynamic systems development method / Technology / Systems engineering / Software testing / Requirement Systems engineering process / Acceptance testing / Dynamic systems development method / Technology / Systems engineering / Software testing / Requirement](/pdf-icon.png) | Add to Reading ListSource URL: apps.adcom.uci.eduLanguage: English - Date: 2013-06-24 20:34:35
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116![Design review / Engineering / Project management / Systems engineering process / Acceptance testing / ISO 10303 / Systems science / Science / Dynamic systems development method / Systems engineering / Software testing / Technology Design review / Engineering / Project management / Systems engineering process / Acceptance testing / ISO 10303 / Systems science / Science / Dynamic systems development method / Systems engineering / Software testing / Technology](/pdf-icon.png) | Add to Reading ListSource URL: apps.adcom.uci.eduLanguage: English - Date: 2013-06-24 20:33:40
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117![Testing of “Dynamic Detection” Presented at the AVAR 2007 Conference in Seoul, South Korea Maik Morgenstern, Andreas Marx Copyright © 2007 AV-Test GmbH, Klewitzstr. 6, 39112 Magdeburg, Germany Please visit our websi Testing of “Dynamic Detection” Presented at the AVAR 2007 Conference in Seoul, South Korea Maik Morgenstern, Andreas Marx Copyright © 2007 AV-Test GmbH, Klewitzstr. 6, 39112 Magdeburg, Germany Please visit our websi](https://www.pdfsearch.io/img/b805adc0c41b86d7cb2128171c266160.jpg) | Add to Reading ListSource URL: www.av-test.orgLanguage: English - Date: 2011-08-07 07:52:49
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118![Testing of “Dynamic Detection” Maik Morgenstern, Andreas Marx AV-Test GmbH, Magdeburg, Germany http://www.av-test.org Presented at the AVAR 2007 Conference in Seoul, South Korea http://www.aavar.org/avar2007/index.ht Testing of “Dynamic Detection” Maik Morgenstern, Andreas Marx AV-Test GmbH, Magdeburg, Germany http://www.av-test.org Presented at the AVAR 2007 Conference in Seoul, South Korea http://www.aavar.org/avar2007/index.ht](https://www.pdfsearch.io/img/5888c6135f77f81416136f402f314bff.jpg) | Add to Reading ListSource URL: www.av-test.orgLanguage: English - Date: 2011-08-07 07:52:49
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119![C How Will Cracking Evolve? The Discovery of MS05-036 Vulnerability Yu, Chi-Sheng ([removed]) C How Will Cracking Evolve? The Discovery of MS05-036 Vulnerability Yu, Chi-Sheng ([removed])](https://www.pdfsearch.io/img/34a25e4a42561686237d28737a56dd72.jpg) | Add to Reading ListSource URL: www.oecd.orgLanguage: English - Date: 2014-07-21 01:39:56
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120![Shuntaint: Emulation-based Security Testing for Formal Verification Bruno Luiz [removed] Shuntaint: Emulation-based Security Testing for Formal Verification Bruno Luiz [removed]](https://www.pdfsearch.io/img/36cfbb4893b94bfbe8820c2934c7b80a.jpg) | Add to Reading ListSource URL: blackhat.comLanguage: English - Date: 2014-12-16 19:06:29
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